@misc{indiciae4de7f7e233a9,
  title = {X-Ray Diffraction (XRD) Characterization Methods for Sigma=3 Twin Defects in Cubic Semiconductor (100) Wafers},
  author = {Park, Yeonjoon and Kim, Hyun Jung and Skuza, Jonathan R. and Lee, Kunik and King, Glen C. and Choi, Sang Hyouk},
  year = {2017},
  url = {https://ntrs.nasa.gov/citations/20180002478},
  note = {Source identifier: 20180002478}
}