TY  - RPRT
TI  - X-Ray Diffraction (XRD) Characterization Methods for Sigma=3 Twin Defects in Cubic Semiconductor (100) Wafers
AU  - Park, Yeonjoon
AU  - Kim, Hyun Jung
AU  - Skuza, Jonathan R.
AU  - Lee, Kunik
AU  - King, Glen C.
AU  - Choi, Sang Hyouk
PY  - 2017
UR  - https://ntrs.nasa.gov/citations/20180002478
ID  - 20180002478
ER  -