@misc{indiciaed3c8ced20f46,
  title = {Error Characterization and Mitigation for 16Nm MLC NAND Flash Memory Under Total Ionizing Dose Effect},
  author = {Li, Yue and Bruck, Jehoshua},
  year = {2018},
  url = {https://ntrs.nasa.gov/citations/20180002499},
  note = {Source identifier: 20180002499}
}