TY  - RPRT
TI  - Error Characterization and Mitigation for 16Nm MLC NAND Flash Memory Under Total Ionizing Dose Effect
AU  - Li, Yue
AU  - Bruck, Jehoshua
PY  - 2018
UR  - https://ntrs.nasa.gov/citations/20180002499
ID  - 20180002499
ER  -