TY  - RPRT
TI  - A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors
AU  - Brusse, Jay A.
AU  - Panashchenko, Lyudmyla
PY  - 2018
UR  - https://ntrs.nasa.gov/citations/20180007084
ID  - 20180007084
ER  -