@misc{indiciae5204afb336a1,
  title = {Radiation Hardness Study on SiC Power MOSFETs},
  author = {Zhu, Xingguang and Lauenstein, J.-M. and Bolonikov, A. and Jacob, B. and Kashyap, A. and Sariri, K. and Chen, Y.},
  year = {2017},
  url = {https://ntrs.nasa.gov/citations/20190001574},
  note = {Source identifier: 20190001574}
}