@misc{indiciaefcf9f73ca337,
  title = {A Screening Method Using Pulsed-Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors},
  author = {Brusse, Jay and Panashchenko, Lyudmyla},
  year = {2018},
  url = {https://ntrs.nasa.gov/citations/20190001732},
  note = {Source identifier: 20190001732}
}