TY  - RPRT
TI  - Evaluation of X-Ray Reflectors by Optical Diffraction Patterns
AU  - Hayashi, Takayuki
AU  - Okajima, Takashi
AU  - Soong, Yang
PY  - 2018
UR  - https://ntrs.nasa.gov/citations/20190002394
ID  - 20190002394
ER  -