@misc{indiciae7be952da10ce,
  title = {Rapid Tools for an AFP Manufacturing Defects Assessment Framework},
  author = {Bahamonde Jacome, Luis G. and Albazzan, Mazen A. and Chevalier, Pierre L. and Gürdal, Zafer and Tatting, Brian F. and Harik, Ramy},
  year = {2018},
  url = {https://ntrs.nasa.gov/citations/20200002542},
  note = {Source identifier: 20200002542}
}