TY  - RPRT
TI  - Single-event upset in evolving commercial silicon-on-insulator microprocessor technologies
AU  - Yoder, G. I.
AU  - Johnston, A. H.
AU  - Swift, G. M.
AU  - Farmanesh, F. H.
AU  - Irom, F.
PY  - 2003
UR  - https://ntrs.nasa.gov/citations/20210002164
ID  - 20210002164
ER  -