TY  - RPRT
TI  - Snapdragon 820 SEE testing and on-site stuck bit mitigation
AU  - Cui, Matthew
AU  - Vartanian, Sergeh
AU  - Guertin, Steven M.
PY  - 2017
UR  - https://ntrs.nasa.gov/citations/20210008056
ID  - 20210008056
ER  -