@misc{indiciaeb3d2352e6f61,
  title = {Evaluating Elevated Temperature DRAM Stuck Bit Sensitivity at Room Temperature},
  author = {Sheldon, Douglas J. and Allen, Gregory R. and Vanacore, Joseph and Blaisdell-Pijuan, Paris and Delaney, Sam W. and Nguyen, Duc N. and Parker, Wilson P. and Guertin, Steven M.},
  year = {2019},
  url = {https://ntrs.nasa.gov/citations/20210012116},
  note = {Source identifier: 20210012116}
}