TY  - RPRT
TI  - Space Induced Discharge Model to Be Used on Interface Circuit Vulnerability Assessment
AU  - Xie, Julie
AU  - Kim, Wousik
AU  - Chinn, James Z.
AU  - Wong, Kit Pui F.
PY  - 2022
UR  - https://ntrs.nasa.gov/citations/20230007008
ID  - 20230007008
ER  -