@misc{indiciae324c70f2b70d,
  title = {A Screening Method Using Pulsed Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors},
  author = {Jay Brusse and Lyudmyla Ochs},
  year = {2024},
  url = {https://ntrs.nasa.gov/citations/20240015425},
  note = {Source identifier: 20240015425}
}