TY  - RPRT
TI  - A Screening Method Using Pulsed Power Combined with Infrared Imaging to Detect Pattern Defects in Bulk Metal Foil or Thin Film Resistors
AU  - Jay Brusse
AU  - Lyudmyla Ochs
PY  - 2024
UR  - https://ntrs.nasa.gov/citations/20240015425
ID  - 20240015425
ER  -