TY  - RPRT
TI  - Reliability Impacts of Non-Destructive Single-Event Latch-Ups in Commercial Electronics
AU  - Stephen Martinez
AU  - Razvan Gaza
AU  - Ray Ladbury
AU  - Lyudmyla Ochs
AU  - Greg Allen
AU  - Alyson Topper
AU  - Timothy Mondy
AU  - Robert Hodson
PY  - 2025
UR  - https://ntrs.nasa.gov/citations/20250006971
ID  - 20250006971
ER  -