TY  - RPRT
TI  - Using Accelerated Testing To Predict Module Reliability: Preprint
AU  - Wohlgemuth, John H.
AU  - Kurtz, Sarah
PY  - 2011
DO  - 10.1109/pvsc.2011.6185927
UR  - https://www.osti.gov/biblio/1022294
ID  - 1022294
ER  -