@misc{indiciae31e71ee09e14,
  title = {System Verification Through Reliability, Availability, Maintainability (RAM) Analysis \& Technology Readiness Levels (TRLs)},
  author = {Opare, Jr, Emmanuel Ohene and Park, Charles V},
  year = {2011},
  url = {https://www.osti.gov/biblio/1027894},
  note = {Source identifier: 1027894}
}