@misc{indiciae65f1fe8fbddc,
  title = {FXR Optimization Project: Determining Beam Quality By Cathode Plasma Image Analysis},
  author = {Houck, T. L. and Ong, M. M. and Paris, R. D.},
  year = {2012},
  doi = {10.2172/1059080},
  url = {https://www.osti.gov/biblio/1059080},
  note = {Source identifier: 1059080}
}