@misc{indiciae99ada71751a3,
  title = {Failure Analysis and Reliability Model Development for Microsystems- Enabled Photovoltaics.},
  author = {Yang, Benjamin Bing-Yeh and Cruz-Campa, Jose Luis and Haase, Gad S. and Tangyunyong, Paiboon and Resnick, Paul James and Okandan, Murat and Nielson, Gregory N.},
  year = {2013},
  url = {https://www.osti.gov/biblio/1083083},
  note = {Source identifier: 1083083}
}