@misc{indiciae95fc59178f19,
  title = {Progress in SiC MOSFET Reliability.},
  author = {Hughart, David Russell and Flicker, Jack David and Kaplar, Robert and DasGupta, Sandeepan and Atcitty, Stanley and Marinella, Matthew},
  year = {2013},
  doi = {10.1149/05804.0211ecst},
  url = {https://www.osti.gov/biblio/1106747},
  note = {Source identifier: 1106747}
}