TY  - RPRT
TI  - Progress in SiC MOSFET Reliability.
AU  - Hughart, David Russell
AU  - Flicker, Jack David
AU  - Kaplar, Robert
AU  - DasGupta, Sandeepan
AU  - Atcitty, Stanley
AU  - Marinella, Matthew
PY  - 2013
DO  - 10.1149/05804.0211ecst
UR  - https://www.osti.gov/biblio/1106747
ID  - 1106747
ER  -