@misc{indiciae5121ae267946,
  title = {Evaluating Application Resilience with XRay},
  author = {Chen, Sui and Bronevetsky, Greg and Li, Bin and Casas-Guix, Marc and Peng, Lu},
  year = {2015},
  doi = {10.2172/1184175},
  url = {https://www.osti.gov/biblio/1184175},
  note = {Source identifier: 1184175}
}