TY  - RPRT
TI  - High pressure Laue diffraction and its application to study microstructural changes during the α → β phase transition in Si
AU  - Popov, D.
AU  - Park, C.
AU  - Kenney-Benson, C.
AU  - Shen, G.
PY  - 2015
DO  - 10.1063/1.4926894
UR  - https://www.osti.gov/biblio/1203736
ID  - 1203736
ER  -