@misc{indiciaef747602c7528,
  title = {Post-Mortem Characterization of Shocked Cu-Be Interfaces Using Electron Backscattered Diffraction (EBSD)},
  author = {Tegtmeier, Eric Lee and Hammerberg, James Edward and Loomis, Eric Nicholas and Papin, Pallas Athene and Cooley, Jason Christopher and Gray, George Thompson},
  year = {2016},
  url = {https://www.osti.gov/biblio/1237213},
  note = {Source identifier: 1237213}
}