TY  - RPRT
TI  - Post-Mortem Characterization of Shocked Cu-Be Interfaces Using Electron Backscattered Diffraction (EBSD)
AU  - Tegtmeier, Eric Lee
AU  - Hammerberg, James Edward
AU  - Loomis, Eric Nicholas
AU  - Papin, Pallas Athene
AU  - Cooley, Jason Christopher
AU  - Gray, George Thompson
PY  - 2016
UR  - https://www.osti.gov/biblio/1237213
ID  - 1237213
ER  -