TY  - RPRT
TI  - Nanoscale temperature mapping in operating microelectronic devices
AU  - Mecklenburg, Matthew
AU  - Hubbard, William A.
AU  - White, E. R.
AU  - Dhall, Rohan
AU  - Cronin, Stephen B.
AU  - Aloni, Shaul
AU  - Regan, B. C.
PY  - 2015
DO  - 10.1126/science.aaa2433
UR  - https://www.osti.gov/biblio/1253993
ID  - 1253993
ER  -