@misc{indiciae190a0c1ca78c,
  title = {Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis},
  author = {Lutterotti, Luca and Vasin, Roman and Wenk, Hans-Rudolf},
  year = {2014},
  doi = {10.1017/s0885715613001346},
  url = {https://www.osti.gov/biblio/1327043},
  note = {Source identifier: 1327043}
}