TY  - RPRT
TI  - Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis
AU  - Lutterotti, Luca
AU  - Vasin, Roman
AU  - Wenk, Hans-Rudolf
PY  - 2014
DO  - 10.1017/s0885715613001346
UR  - https://www.osti.gov/biblio/1327043
ID  - 1327043
ER  -