@misc{indiciae0972d1a7ce1c,
  title = {Dislocation Characterization in 4H-SiC Crystals},
  author = {Sumakeris, Joseph J. and Leonard, R. T. and Deyneka, Eugene and Khlebnikov, Yuri and Powell, Adrian R. and Seaman, Jeff and Paisley, Michael J. and Tsevtkov, V. and Guo, Jian Qiu and Yang, Yu and Dudley, Michael and Balkas, Elif},
  year = {2016},
  doi = {10.4028/www.scientific.net/msf.858.393},
  url = {https://www.osti.gov/biblio/1328034},
  note = {Source identifier: 1328034}
}