TY  - RPRT
TI  - Three dimensional strained semiconductors
AU  - Voss, Lars
AU  - Conway, Adam
AU  - Nikolic, Rebecca J.
AU  - Leao, Cedric Rocha
AU  - Shao, Qinghui
PY  - 2016
UR  - https://www.osti.gov/biblio/1331170
ID  - 1331170
ER  -