TY  - RPRT
TI  - Optimizing surface defects for atomic-scale electronics: Si dangling bonds
AU  - Scherpelz, Peter
AU  - Galli, Giulia
PY  - 2017
DO  - 10.1103/physrevmaterials.1.021602
UR  - https://www.osti.gov/biblio/1372591
ID  - 1372591
ER  -