TY  - RPRT
TI  - X-ray diffraction microscopy of lithiated silicon microstructures
AU  - Fister, Tim T.
AU  - Goldman, Jason L.
AU  - Long, Brandon R.
AU  - Nuzzo, Ralph G.
AU  - Gewirth, Andrew A.
AU  - Fenter, Paul A.
PY  - 2013
DO  - 10.1063/1.4798554
UR  - https://www.osti.gov/biblio/1382014
ID  - 1382014
ER  -