TY  - RPRT
TI  - Compact Models for Defect Diffusivity in Semiconductor Alloys.
AU  - Wright, Alan F.
AU  - Modine, Normand A.
AU  - Lee, Stephen R.
AU  - Foiles, Stephen M.
PY  - 2017
DO  - 10.2172/1395644
UR  - https://www.osti.gov/biblio/1395644
ID  - 1395644
ER  -