TY  - RPRT
TI  - Methodology for Wide Band-Gap Device Dynamic Characterization
AU  - Zhang, Zheyu
AU  - Guo, Ben
AU  - Wang, Fei Fred
AU  - Jones, Edward A.
AU  - Tolbert, Leon M.
AU  - Blalock, Benjamin J.
PY  - 2017
DO  - 10.1109/tpel.2017.2655491
UR  - https://www.osti.gov/biblio/1399113
ID  - 1399113
ER  -