@misc{indiciaefbbae54b4d7f,
  title = {Test circuits for integrated circuit counterfeit detection},
  author = {Helinski, Ryan and Pierson, Jr., Lyndon G. and Cole, Jr., Edward I. and Thai, Tan Q.},
  year = {2018},
  url = {https://www.osti.gov/biblio/1471676},
  note = {Source identifier: 1471676}
}