TY  - RPRT
TI  - Test circuits for integrated circuit counterfeit detection
AU  - Helinski, Ryan
AU  - Pierson, Jr., Lyndon G.
AU  - Cole, Jr., Edward I.
AU  - Thai, Tan Q.
PY  - 2018
UR  - https://www.osti.gov/biblio/1471676
ID  - 1471676
ER  -