@misc{indiciae011a3a327657,
  title = {Casing-integrity mapping using top-casing electrodes and surface based EM fields},
  author = {Wilt, Michael and Um, Evan and Nichols, Edward and Weiss, Chester J. and Nieuwenhuis, Greg and Maclennan, Kris},
  year = {2018},
  doi = {10.1190/segam2018-2983425.1},
  url = {https://www.osti.gov/biblio/1498488},
  note = {Source identifier: 1498488}
}