TY  - RPRT
TI  - Casing-integrity mapping using top-casing electrodes and surface based EM fields
AU  - Wilt, Michael
AU  - Um, Evan
AU  - Nichols, Edward
AU  - Weiss, Chester J.
AU  - Nieuwenhuis, Greg
AU  - Maclennan, Kris
PY  - 2018
DO  - 10.1190/segam2018-2983425.1
UR  - https://www.osti.gov/biblio/1498488
ID  - 1498488
ER  -