TY  - RPRT
TI  - Structural Reliability of Cathode Contact Materials in Planar SOFCs
AU  - Karri, Naveen K. (ORCID:0000000273819047)
AU  - Koeppel, Brian J. (ORCID:0000000295295088)
AU  - Nguyen, Ba N.
AU  - Lai, Kevin
PY  - 2017
DO  - 10.1149/07801.1701ecst
UR  - https://www.osti.gov/biblio/1507765
ID  - 1507765
ER  -