TY  - RPRT
TI  - Synchrotron Based Microstructural Characterization Method Development for Pu Oxides
AU  - DeVore II, M. A.
AU  - Venzie, J.
AU  - Wellons, M.
AU  - Fortner, J.
AU  - Schuller-Nickels, L.
AU  - Powell, B.
PY  - 2019
DO  - 10.2172/1568799
UR  - https://www.osti.gov/biblio/1568799
ID  - 1568799
ER  -