TY  - RPRT
TI  - Diffraction paradox: An unusually broad diffraction background marks high quality graphene
AU  - Chen, S.
AU  - Horn von Hoegen, M.
AU  - Thiel, P. A.
AU  - Tringides, M. C.
PY  - 2019
DO  - 10.1103/physrevb.100.155307
UR  - https://www.osti.gov/biblio/1574018
ID  - 1574018
ER  -