TY  - RPRT
TI  - Modeling dislocation-related leakage currents in GaN p-n diodes
AU  - Robertson, C. A. (ORCID:0000000300122262)
AU  - Qwah, K. S.
AU  - Wu, Y. -R. (ORCID:0000000214573681)
AU  - Speck, J. S.
PY  - 2019
DO  - 10.1063/1.5123394
UR  - https://www.osti.gov/biblio/1580624
ID  - 1580624
ER  -