TY  - RPRT
TI  - Electroplasticity effects in Haynes 230
AU  - McNeff, Patrick S.
AU  - Paul, Brian K.
PY  - 2020
DO  - 10.1016/j.jallcom.2020.154438
UR  - https://www.osti.gov/biblio/1602389
ID  - 1602389
ER  -