TY  - RPRT
TI  - Discrete dislocation dynamics-based prediction of dislocation density from diffraction line profiles of Ta
AU  - Tallman, Aaron Ellis
AU  - Pokharel, Reeju
AU  - Capolungo, Laurent
PY  - 2020
UR  - https://www.osti.gov/biblio/1602730
ID  - 1602730
ER  -