@misc{indiciae19efec37cf77,
  title = {Measurement-induced criticality in random quantum circuits},
  author = {Jian, Chao-Ming and You, Yi-Zhuang and Vasseur, Romain and Ludwig, Andreas W. W.},
  year = {2020},
  doi = {10.1103/physrevb.101.104302},
  url = {https://www.osti.gov/biblio/1603484},
  note = {Source identifier: 1603484}
}