TY  - RPRT
TI  - Measurement-induced criticality in random quantum circuits
AU  - Jian, Chao-Ming
AU  - You, Yi-Zhuang
AU  - Vasseur, Romain
AU  - Ludwig, Andreas W. W.
PY  - 2020
DO  - 10.1103/physrevb.101.104302
UR  - https://www.osti.gov/biblio/1603484
ID  - 1603484
ER  -