TY  - RPRT
TI  - Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance
AU  - Dagdeviren, Omur E.
AU  - Schwarz, Udo D.
PY  - 2019
DO  - 10.1063/1.5089634
UR  - https://www.osti.gov/biblio/1612413
ID  - 1612413
ER  -