TY  - RPRT
TI  - Electrochemical-Reaction-Driven Interfacial Stress in a Solid-Solid Layered Architecture
AU  - Hao, Feng
AU  - Wang, Wenxiu
AU  - Mukherjee, Partha P.
PY  - 2019
DO  - 10.1103/physrevapplied.11.034038
UR  - https://www.osti.gov/biblio/1614059
ID  - 1614059
ER  -