@misc{indiciae046abc6493af,
  title = {X-ray topography characterization of gallium nitride substrates for power device development},
  author = {Raghothamachar, Balaji and Liu, Yafei and Peng, Hongyu and Ailihumaer, Tuerxun and Dudley, Michael and Shahedipour-Sandvik, F. Shadi and Jones, Kenneth A. and Armstrong, Andrew and Allerman, Andrew A. and Han, Jung and Fu, Houqiang and Fu, Kai and Zhao, Yuji},
  year = {2020},
  doi = {10.1016/j.jcrysgro.2020.125709},
  url = {https://www.osti.gov/biblio/1634813},
  note = {Source identifier: 1634813}
}